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1

Heat capacity and thermal conductivity of hexagonal pyrolytic boron nitride

Sichel, E., Miller, R., Abrahams, M., Buiocchi, C.

Journal:

Physical Review B

Year:

1976

Language:

english

File:

PDF, 493 KB

english, 1976

2

Twins and stacking faults in vapor grown GaAs

M.S. Abrahams, C.J. Buiocchi

Journal:

Journal of Physics and Chemistry of Solids

Year:

1967

Language:

english

File:

PDF, 2.07 MB

english, 1967

3

Effect of lattice expansion on the Curie temperature of granular nickel films

M. Rayl, P.J. Wojtowicz, M.S. Abrahams, R.L. Harvey, C.J. Buiocchi

Journal:

Physics Letters A

Year:

1971

Language:

english

File:

PDF, 155 KB

english, 1971

4

Cross-sectional transmission electron microscopy study of the structure of titanium diffusion barriers on (100) silicon

J.T. McGinn, J.-S. Maa, C.J. Buiocchi

Journal:

Materials Science and Engineering: A

Year:

1989

Language:

english

File:

PDF, 469 KB

english, 1989

5

Dislocation morphology in graded heterojunctions: GaAs1−xPx

M. S. Abrahams, L. R. Weisberg, C. J. Buiocchi, J. Blanc

Journal:

Journal of Materials Science

Year:

1969

Language:

english

File:

PDF, 2.95 MB

english, 1969

6

Heteroepitaxial silicon characterization: Microstructure as related to UV reflectometry

G.W. Cullen, M.T. Duffy, M.S. Abrahams, C.J. Buiocchi

Journal:

Journal of Crystal Growth

Year:

1983

Language:

english

File:

PDF, 480 KB

english, 1983

7

Etching of Dislocations on the Low-Index Faces of GaAs

Abrahams, M. S., Buiocchi, C. J.

Journal:

Journal of Applied Physics

Year:

1965

Language:

english

File:

PDF, 1.22 MB

english, 1965

8

Preparation of [100]-Oriented Foils of GaAs for Transmission Electron Microscopy

Year:

1967

Language:

english

File:

PDF, 422 KB

english, 1967

9

Dislocations in vapor-grown compositionally graded (In,Ga)P

Abrahams, M. S., Buiocchi, C. J., Olsen, G. H.

Journal:

Journal of Applied Physics

Year:

1975

Language:

english

File:

PDF, 1.31 MB

english, 1975

10

Reduction of dislocation densities in heteroepitaxial III−V VPE semiconductors

Olsen, G. H., Abrahams, M. S., Buiocchi, C. J., Zamerowski, T. J.

Journal:

Journal of Applied Physics

Year:

1975

Language:

english

File:

PDF, 583 KB

english, 1975

11

Misfit dislocations in heteroepitaxial Si on sapphire

M. S. Abrahams, C. J. Buiocchi, J. F. Corboy, G. W. Cullen

Year:

1976

Language:

english

File:

PDF, 478 KB

english, 1976

12

Addendum: Cross−sectional specimens for transmission electron microscopy

M. S. Abrahams, C. J. Buiocchi

Year:

1975

Language:

english

File:

PDF, 251 KB

english, 1975

13

Shear strain at corners and edges of epitaxial silicon on sapphire

Abrahams, M. S., Blanc, J., Buiocchi, C. J., Ham, W. E.

Journal:

Journal of Applied Physics

Year:

1978

Language:

english

File:

PDF, 699 KB

english, 1978

14

The Si/SiO2 interface examined by cross-sectional transmission electron microscopy

Blanc, J., Buiocchi, C. J., Abrahams, M. S., Ham, W. E.

Journal:

Applied Physics Letters

Year:

1977

Language:

english

File:

PDF, 380 KB

english, 1977

15

Cross-sectional electron microscopy of silicon on sapphire

Abrahams, M. S., Buiocchi, C. J.

Journal:

Applied Physics Letters

Year:

1975

Language:

english

File:

PDF, 486 KB

english, 1975

16

The formation and elimination of helical dislocations in semiconductors

Abrahams, M. S., Blanc, J., Buiocchi, C. J.

Journal:

Philosophical Magazine

Year:

1971

Language:

english

File:

PDF, 1.18 MB

english, 1971

17

AIP Conference Proceedings [AIP MAGNETISM AND MAGNETIC MATERIALS — 1971 Parts 1 and 2 - Chicago, IL, USA (1971)] - CRITICAL SIZE FOR FERROMAGNETISM IN NICKEL

Rayl, M., Wojtowicz, P. J., Abrahams, M. S., Harvey, R. L., Buiocchi, C. J., Graham, C. D., Rhyne, J. J.

Year:

1972

Language:

english

File:

PDF, 812 KB

english, 1972

18

AIP Conference Proceedings [AIP MAGNETISM AND MAGNETIC MATERIALS — 1971 Parts 1 and 2 - Chicago, IL, USA (1971)] - CRITICAL SIZE FOR FERROMAGNETISM IN NICKEL

Rayl, M., Wojtowicz, P. J., Abrahams, M. S., Harvey, R. L., Buiocchi, C. J., Graham, C. D., Rhyne, J. J.

Year:

1972

File:

PDF, 812 KB

1972

19

ChemInform Abstract: DIRECT OBSERVATION OF THE STRUCTURE OF THIN, COMMERCIALLY USEFUL SILICON ON SAPPHIRE FILMS BY CROSS SECTION TRANSMISSION ELECTRON MICROSCOPY

HAM, W. E., ABRAHAMS, M. S., BUIOCCHI, C. J., BLANC, J.

Journal:

Chemischer Informationsdienst

Year:

1977

File:

PDF, 109 KB

1977